New Fluorinated Resins for 157 nm Lithography Application
نویسندگان
چکیده
منابع مشابه
Single Layer Fluoropolymer Resists for 157 nm Lithography
We have developed a family of 157 nm resists that utilize fluorinated terpolymer resins composed of 1) tetrafluoroethylene (TFE), 2) a norbornene fluoroalcohol (NBFOH), and 3) t-butyl acrylate (t-BA). TFE incorporation reduces optical absorbance at 157 nm, while the presence of a norbornene functionalized with hexafluoroisopropanol groups contributes to aqueous base (developer) solubility and e...
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Bottom anti-reflective coatings (BARCs) are essential for achieving the 65-nm node resolution target by minimizing the substrate reflectivity to less than 1% and by planarizing substrates. We believe that the developments in 157-nm BARC products are on track to make them available for timely application in 157-nm lithography. We have made some significant improvements in resist compatibility an...
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Dissolution behavior of chemically amplified resist polymers for 248-, 193-, and 157-nm lithography
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The introduction of the 157-nm wavelength for next-generation optical lithography has created a need for new soft (polymeric) or hard (quartz) pellicle materials optimized for that wavelength. The design and development of ultratransparent fluoropolymers suitable for 157-nm soft-pellicle applications has produced several promising candidate materials with absorbances <0.03/μm to achieve pellicl...
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ژورنال
عنوان ژورنال: Journal of Photopolymer Science and Technology
سال: 2003
ISSN: 0914-9244,1349-6336
DOI: 10.2494/photopolymer.16.581